Single-molecule localization microscopy requires sparse activation of emitters to circumvent the diffraction limit. In densely labeled or thick samples, overlap of emitter images is inevitable. Single-molecule localization of these samples results in a biased parameter estimate with a wrong model of the number of emitters. On the other hand, multiple emitter fitting suffers from point spread function degeneracy, which increases model and parameter uncertainty. To better estimate the model, parameters and uncertainties, a three-dimensional Bayesian multiple emitter fitting algorithm was constructed using Reversible Jump Markov Chain Monte Carlo. It reconstructs the posterior density of both the model and the parameters, namely the three-dimensional position and photon intensity, of overlapping emitters. The ability of the algorithm to separate two emitters at varying distance was evaluated using an astigmatic point spread function. We found that for astigmatic imaging, the posterior distribution of the emitter positions is multimodal when emitters are within two times the in-focus standard deviation of the point spread function. This multimodality describes the ambiguity in position that astigmatism introduces in localization microscopy. Biplane imaging was also tested, proving capable of separating emitters up to 0.75 times the in-focus standard deviation of the point spread function while staying free of multimodality. The posteriors seen in astigmatic and biplane imaging demonstrate how the algorithm can identify point spread function degeneracy and evaluate imaging techniques for three-dimensional multiple-emitter fitting performance.
© 2023. The Author(s).